作者：Ardell, Sarah M.; Martsul, Alena; Johnson, Milo S.; Kryazhimskiy, Sergey
作者单位：University of California System; University of California San Diego; University of California System; University of California Berkeley; United States Department of Energy (DOE); Lawrence Berkeley National Laboratory; Illumina
摘要：Predicting how new mutations alter phenotypes is difficult because mutational effects vary across genotypes and environments. Recently discovered global epistasis, in which the fitness effects of mutations scale with the fitness of the background genotype, can improve predictions, but how the environment modulates this scaling is unknown. We measured the fitness effects of similar to 100 insertion mutations in 42 strains of Saccharomyces cerevisiae in six laboratory environments and found that...
作者：Ndembi, Nicaise; Karim, Salim S. Abdool
作者单位：University of Kwazulu Natal; Columbia University
作者：Nusbaum, Howard
作者单位：University of Chicago; University of Chicago
作者：Wong, Gifford J.
作者单位：Science & Technology Policy Institute
作者：Tian, Yuan; Gong, Xiaoguo; Xu, Mingjie; Qiu, Caihao; Han, Ying; Bi, Yutong; Estrada, Leonardo Velasco; Boltynjuk, Evgeniy; Hahn, Horst; Han, Jian; Srolovitz, David J.; Pan, Xiaoqing
作者单位：University of California System; University of California Irvine; University of Hong Kong; University of California System; University of California Irvine; City University of Hong Kong; Helmholtz Association; Karlsruhe Institute of Technology; University of Oklahoma System; University of Oklahoma - Norman; University of Hong Kong; University of California System; University of California Irvine
摘要：Near-rigid-body grain rotation is commonly observed during grain growth, recrystallization, and plastic deformation in nanocrystalline materials. Despite decades of research, the dominant mechanisms underlying grain rotation remain enigmatic. We present direct evidence that grain rotation occurs through the motion of disconnections (line defects with step and dislocation character) along grain boundaries in platinum thin films. State-of-the-art in situ four-dimensional scanning transmission el...
