LOCALIZED KNOWLEDGE SPILLOVERS AND PATENT CITATIONS: A DISTANCE-BASED APPROACH

• 成果类型: Article
• 署名作者: Murata, Yasusada; Nakajima, Ryo; Okamoto, Ryosuke; Tamura, Ryuichi
• 署名单位: Nihon University; Keio University; Hitotsubashi University
• 刊物名称: REVIEW OF ECONOMICS AND STATISTICS
• ISSN/ISSBN: 0034-6535
• DOI: 10.1162/REST_a_00422
• 发表日期: 2014-12
• 页码: 967-985
• 关键词: manufacturing-industries; geography; reassessment; exogeneity

摘要

We develop a new distance-based test of localized knowledge spillovers that embeds the concept of control patents. Using microgeographic data, we identify localization distance for each technology class while allowing for spillovers across geographic units. We revisit the debate between Thompson and Fox-Kean (2005a, 2005b) and Henderson, Jaffe, and Trajtenberg (2005) on the existence of localized knowledge spillovers and find solid evidence supporting localization even when using finely grained controls. Unless biases induced by imperfect matching between citing and control patents due to unobserved heterogeneity are extremely large, our distance-based test detects localization for the majority of technology classes.