SOME RESULTS ON 2n-m DESIGNS OF RESOLUTION IV WITH (WEAK) MINIMUM ABERRATION

• 成果类型: Article
• 署名作者: Chen, Hegang H.; Cheng, Ching-Shui
• 署名单位: University System of Maryland; University of Maryland Baltimore; University of California System; University of California Berkeley
• 刊物名称: ANNALS OF STATISTICS
• ISSN/ISSBN: 0090-5364
• DOI: 10.1214/08-AOS670
• 发表日期: 2009
• 页码: 3600-3615
• 关键词: fractional factorial-designs; binary linear codes; caps

摘要

It is known that all resolution IV regular 2(n-m) designs of run size N = 2(n-m) where 5N/16 < n < N/2 must be projections of the maximal even design with N/2 factors and, therefore, are even designs. This paper derives a general and explicit relationship between the wordlength pattern of any even 2(n-m) design and that of its complement in the maximal even design. Using these identities, we identify some (weak) minimum aberration 2(n-m) designs of resolution IV and the structures of their complementary designs. Based on these results, several families of minimum aberration 2(n-m) designs of resolution IV are constructed.