An arithmetic model for the total disorder process
成果类型：
Article
署名作者：
Hughes, C. P.; Nikeghbali, A.; Yor, M.
署名单位：
University of York - UK; University of Zurich; Universite Paris Cite; Sorbonne Universite; Centre National de la Recherche Scientifique (CNRS); CNRS - National Institute for Mathematical Sciences (INSMI); Sorbonne Universite; Universite Paris Cite
刊物名称：
PROBABILITY THEORY AND RELATED FIELDS
ISSN/ISSBN：
0178-8051
DOI：
10.1007/s00440-007-0079-9
发表日期：
2008
页码：
47-59
关键词：
摘要：
We prove a multidimensional extension of Selberg's central limit theorem for the logarithm of the Riemann zeta function on the critical line. The limit is a totally disordered process, whose coordinates are all independent and Gaussian.
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