The (Surprising) Sample Optimality of Greedy Procedures for Large-Scale Ranking and Selection

• 成果类型: Article
• 署名作者: Li, Zaile; Fan, Weiwei; Hong, L. Jeff
• 署名单位: Fudan University; Tongji University; Fudan University
• 刊物名称: MANAGEMENT SCIENCE
• ISSN/ISSBN: 0025-1909
• DOI: 10.1287/mnsc.2023.00694
• 发表日期: 2025
• 关键词: ranking and selection; sample optimality; greedy; boundary-crossing

摘要

Ranking and selection (R&S) aims to select the best alternative with the largest mean performance from a finite set of alternatives. Recently, considerable attention has turned toward the large-scale R&S problem which involves a large number of alternatives. Ideal largescale R&S procedures should be sample optimal; that is, the total sample size required to deliver an asymptotically nonzero probability of correct selection (PCS) grows at the minimal order (linear order) in the number of alternatives, k . Surprisingly, we discover that the na & iuml;ve greedy procedure, which keeps sampling the alternative with the largest running average, performs strikingly well and appears sample optimal. To understand this discovery, we develop a new boundary -crossing perspective and prove that the greedy procedure is sample optimal for the scenarios where the best mean maintains at least a positive constant away from all other means as k increases. We further show that the derived PCS lower bound is asymptotically tight for the slippage configuration of means with a common variance. For other scenarios, we consider the probability of good selection and find that the result depends on the growth behavior of the number of good alternatives: if it remains bounded ask k increases, the sample optimality still holds; otherwise, the result may change. Moreover, we propose the explore -first greedy procedures by adding an exploration phase to the greedy procedure. The procedures are proven to be sample optimal and consistent under the same assumptions. Last, we numerically investigate the performance of our greedy procedures in solving large-scale R&S problems.