Sequential inspection under capacity constraints
成果类型：
Article
署名作者：
Yao, DD; Zheng, SH
署名单位：
Columbia University; Hong Kong University of Science & Technology
刊物名称：
OPERATIONS RESEARCH
ISSN/ISSBN：
0030-364X
DOI：
10.1287/opre.47.3.410
发表日期：
1999
页码：
410-421
关键词：
摘要：
We study the inspection process in the context of multistage batch manufacturing, focusing on interstage coordination under capacity limits. The problem is formulated as a constrained Markov decision program. We establish the optimality of a sequential policy that is characterized by a sequence of thresholds, with certain randomization at the thresholds. We further show that such an optimal policy can be completely derived through solving a linear program, and that randomization is needed at no more than two threshold values. We discuss an application in semiconductor wafer fabrication, which motivates our study.