Using neural network analysis to uncover the trace effects of national culture
成果类型：
Article
署名作者：
Veiga, JF; Lubatkin, M; Calori, R; Very, P; Tung, YA
署名单位：
University of Connecticut
刊物名称：
JOURNAL OF INTERNATIONAL BUSINESS STUDIES
ISSN/ISSBN：
0047-2506
DOI：
10.1057/palgrave.jibs.8490903
发表日期：
2000
页码：
223-238
关键词：
摘要：
The primary objective of this paper an artificial intelligence technique known as neural network analysis as an aid to uncovering the underlying patterns, or trace effects, of national culture. To make our case, we provide an application of the technique's pattern recognition capability utilizing survey data from top executives in French and British firms. We conclude by interpreting rbe trace effects found and encouraging aging the use of this tool by crosscultural researchers in the future.
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